DocumentCode :
3056143
Title :
Author index
fYear :
1997
fDate :
April 27 1997-May 1 1997
Firstpage :
465
Lastpage :
466
Abstract :
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1997., 15th IEEE
Conference_Location :
Monterey, CA, USA
ISSN :
1093-0167
Print_ISBN :
0-8186-7810-0
Type :
conf
DOI :
10.1109/VTEST.1997.600336
Filename :
600336
Link To Document :
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