• DocumentCode
    3056143
  • Title

    Author index

  • fYear
    1997
  • fDate
    April 27 1997-May 1 1997
  • Firstpage
    465
  • Lastpage
    466
  • Abstract
    The author index contains an entry for each author and coauthor included in the proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1997., 15th IEEE
  • Conference_Location
    Monterey, CA, USA
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-7810-0
  • Type

    conf

  • DOI
    10.1109/VTEST.1997.600336
  • Filename
    600336