Title :
Local threshold and Boolean function based edge detection
Author :
Ahmad, M.B. ; Tae-Sun Choi
Author_Institution :
Dept. of Mechatronics, Kwangju Inst. of Sci. & Tehcnol., South Korea
Abstract :
Localization of edge points in images is one of the most important starting steps in image processing. Many varied edge detection techniques have been proposed. Different edge detectors present distinct and different responses to the same image, showing different details. This work presents a new approach for edge detection. The actual gray level image is locally thresholded using the local mean value to make a binary image. The binary image is checked for edges by comparing with the known edge like patterns, utilizing Boolean algebra. This approach recognizes nearly all, real edges and edges due to noise. For removing edges due to noise, we adopt another approach. This time the actual image is globally thresholded by the variance value of the image. The two resulting images are logically ANDed to get the final edge map.
Keywords :
Boolean functions; computer vision; edge detection; noise; Boolean algebra; Boolean function based edge detection; binary image; computer vision; edge like patterns; edge map; edge points localization; gray level image; image processing; local mean value; local threshold based edge detection; noise; variance value; Boolean algebra; Boolean functions; Brightness; Computer vision; Detectors; Filtering; Hardware; Image edge detection; Image processing; Mechatronics;
Conference_Titel :
Consumer Electronics, 1999. ICCE. International Conference on
Conference_Location :
Los Angeles, CA, USA
Print_ISBN :
0-7803-5123-1
DOI :
10.1109/ICCE.1999.785289