• DocumentCode
    3056249
  • Title

    Entropy extraction in metastability-based TRNG

  • Author

    Suresh, Vikram B. ; Burleson, Wayne P.

  • fYear
    2010
  • fDate
    13-14 June 2010
  • Firstpage
    135
  • Lastpage
    140
  • Abstract
    True Random Number Generators (TRNG) implemented in deep sub micron (DSM) technologies become biased in bit generation due to process variations and fluctuations in operating conditions. A variety of mechanisms ranging from analog and digital circuit techniques to algorithmic post-processing can be employed to remove bias. In this work we compare the effectiveness of digital post-processing using the XOR function and Von Neumann Corrector with circuit calibration technique for a meta-stability based reference TRNG design. The energy consumption per bit is used as the metric for comparison of the different techniques. The results indicate that the calibration technique is effective for 12% larger process variation than the XOR function and extracts entropy comparable to the Von Neumann Corrector at 56% lesser energy/bit. The analysis thereby demonstrates that circuit calibration provides an efficient tradeoff between entropy and energy/bit for removing bias in lightweight TRNG.
  • Keywords
    entropy; logic gates; random number generation; Von Neumann corrector; XOR function; circuit calibration technique; deep sub micron technologies; entropy extraction; meta-stability; true random number generators; Calibration; Circuit noise; Counting circuits; Entropy; Fabrication; Jitter; Metastasis; Random access memory; Random number generation; Ring oscillators; TRNG; entropy; process variation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Hardware-Oriented Security and Trust (HOST), 2010 IEEE International Symposium on
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    978-1-4244-7811-8
  • Type

    conf

  • DOI
    10.1109/HST.2010.5513099
  • Filename
    5513099