DocumentCode :
3056249
Title :
Entropy extraction in metastability-based TRNG
Author :
Suresh, Vikram B. ; Burleson, Wayne P.
fYear :
2010
fDate :
13-14 June 2010
Firstpage :
135
Lastpage :
140
Abstract :
True Random Number Generators (TRNG) implemented in deep sub micron (DSM) technologies become biased in bit generation due to process variations and fluctuations in operating conditions. A variety of mechanisms ranging from analog and digital circuit techniques to algorithmic post-processing can be employed to remove bias. In this work we compare the effectiveness of digital post-processing using the XOR function and Von Neumann Corrector with circuit calibration technique for a meta-stability based reference TRNG design. The energy consumption per bit is used as the metric for comparison of the different techniques. The results indicate that the calibration technique is effective for 12% larger process variation than the XOR function and extracts entropy comparable to the Von Neumann Corrector at 56% lesser energy/bit. The analysis thereby demonstrates that circuit calibration provides an efficient tradeoff between entropy and energy/bit for removing bias in lightweight TRNG.
Keywords :
entropy; logic gates; random number generation; Von Neumann corrector; XOR function; circuit calibration technique; deep sub micron technologies; entropy extraction; meta-stability; true random number generators; Calibration; Circuit noise; Counting circuits; Entropy; Fabrication; Jitter; Metastasis; Random access memory; Random number generation; Ring oscillators; TRNG; entropy; process variation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Hardware-Oriented Security and Trust (HOST), 2010 IEEE International Symposium on
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-7811-8
Type :
conf
DOI :
10.1109/HST.2010.5513099
Filename :
5513099
Link To Document :
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