Title :
Sensitivity analysis of magnetic field sensors utilizing spin-dependent recombination in silicon diodes
Author :
Jander, Albrecht ; Dhagat, Pallavi
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR, USA
Abstract :
This paper presents an analysis of the ultimate magnetic field sensitivity that could be achieved in a sensor utilizing spin-dependent recombination (SDR) in silicon diodes.
Keywords :
electron-hole recombination; magnetic sensors; magnetometers; semiconductor diodes; magnetic field sensitivity; magnetic field sensors; sensitivity analysis; spin-dependent recombination; Frequency; Magnetic field measurement; Magnetic noise; Magnetic sensors; Paramagnetic resonance; Radiative recombination; Semiconductor diodes; Sensitivity analysis; Silicon; Spontaneous emission;
Conference_Titel :
Semiconductor Device Research Symposium, 2009. ISDRS '09. International
Conference_Location :
College Park, MD
Print_ISBN :
978-1-4244-6030-4
Electronic_ISBN :
978-1-4244-6031-1
DOI :
10.1109/ISDRS.2009.5378121
