Step and frequency response testing of waveform recorders

Author

Souders, T.M. ; Flach, D.R. ; Blair, J.J.

Author_Institution

Nat. Inst. of Stand. & Technol., Boulder, CO, USA

fYear

1990

fDate

13-15 Feb 1990

Firstpage

214

Lastpage

220

Abstract

Tutorial material is presented to aid in measuring the step response of waveform recorders and in computing other parameters which may be derived from the step response. Parameters considered include impulse response, transition duration, settling time, and complex frequency response. The measurement approaches follow those recommended in the IEEE Trial Use Standard for digitizing waveform recorders. Illustration examples are given, and guidelines on the choice of step generators are included

Keywords

analogue-digital conversion; automatic testing; computerised signal processing; electronic equipment testing; measurement standards; wave analysers; waveform analysis; IEEE Trial Use Standard; complex frequency response; computerised signal processing; digitizing waveform recorders; equivalent time testing; frequency response testing; impulse response; settling time; step generators; step response; time jitter; transition duration; waveform recorders; Bandwidth; Energy measurement; Frequency domain analysis; Frequency response; Guidelines; Measurement standards; Sampling methods; Standards publication; Testing; Time domain analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1990. IMTC-90. Conference Record., 7th IEEE

Conference_Location

San Jose, CA

Type

conf

DOI

10.1109/IMTC.1990.66001

Filename

66001