Title :
Step and frequency response testing of waveform recorders
Author :
Souders, T.M. ; Flach, D.R. ; Blair, J.J.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
Tutorial material is presented to aid in measuring the step response of waveform recorders and in computing other parameters which may be derived from the step response. Parameters considered include impulse response, transition duration, settling time, and complex frequency response. The measurement approaches follow those recommended in the IEEE Trial Use Standard for digitizing waveform recorders. Illustration examples are given, and guidelines on the choice of step generators are included
Keywords :
analogue-digital conversion; automatic testing; computerised signal processing; electronic equipment testing; measurement standards; wave analysers; waveform analysis; IEEE Trial Use Standard; complex frequency response; computerised signal processing; digitizing waveform recorders; equivalent time testing; frequency response testing; impulse response; settling time; step generators; step response; time jitter; transition duration; waveform recorders; Bandwidth; Energy measurement; Frequency domain analysis; Frequency response; Guidelines; Measurement standards; Sampling methods; Standards publication; Testing; Time domain analysis;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1990. IMTC-90. Conference Record., 7th IEEE
Conference_Location :
San Jose, CA
DOI :
10.1109/IMTC.1990.66001
