Title :
A comparison of power-analysis-resistant digital circuits
Author :
Menendez, Eric ; Mai, Ken
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
Power analysis attacks are a common and effective method of defeating cryptographic systems. Many power-analysis-resistant digital circuit techniques have been previously proposed, leaving the circuit designer a myriad of choices without a simple way to compare and contrast the strengths and weaknesses of each technique. In this paper, we compare four promising power-analysis-resistant digital logic styles against a standard CMOS baseline. By comparing these techniques side by side in a consistent manner we present a clearer picture of the advantages and drawbacks of each. Results are presented for logic gate area, energy consumption, and power-analysis resistance. We also present a novel test structure suitable for measuring power-analysis resistance of individual logic gates in actual silicon.
Keywords :
CMOS digital integrated circuits; cryptography; digital circuits; energy consumption; logic gates; cryptographic systems; energy consumption; logic gate area; power-analysis-resistant digital circuit techniques; power-analysis-resistant digital logic styles; standard CMOS baseline; CMOS logic circuits; CMOS technology; Cryptography; Digital circuits; Electrical resistance measurement; Energy consumption; Logic gates; Logic testing; Power measurement; Routing; TDPL; WDDL; differential power analysis; dual-rail logic; security; switched-capacitor logic;
Conference_Titel :
Hardware-Oriented Security and Trust (HOST), 2010 IEEE International Symposium on
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-7811-8
DOI :
10.1109/HST.2010.5513112