DocumentCode :
3056702
Title :
Cure, temperature and time dependent constitutive modeling of moulding compounds
Author :
Jansen, K.M.B. ; Wang, L. ; van ´t Hof, C. ; Ernst, L.J. ; Bressers, H.J.L. ; Zhang, G.Q.
Author_Institution :
Delft Univ. of Technol., Netherlands
fYear :
2004
fDate :
2004
Firstpage :
581
Lastpage :
585
Abstract :
Moulding compounds are used as encapsulation materials for electronic components. Their task is to protect the components from mechanical shocks and environmental effects such as moisture. Moulding compounds are epoxy resins filled with inorganic (silica) particles, carbon black and processing aids. They show a clear viscoelastic behaviour which is not only temperature but also cure dependent. Due to both thermal and reaction shrinkage, moulding compounds introduce residual stresses which may eventually result in product failure. Therefore they can be considered as key materials for overall thermomechanical reliability. This paper deals with the characterization and modeling of the mechanical behaviour of such moulding compounds. The focus is on the effects of the degree of cure and the filler concentration.
Keywords :
curing; encapsulation; filled polymers; integrated circuit measurement; integrated circuit modelling; integrated circuit packaging; integrated circuit reliability; internal stresses; moulding; plastic packaging; thermal management (packaging); thermal stresses; C; SiO2; carbon black fillers; cure dependent constitutive modeling; degree of cure; electronic components; encapsulation materials; environmental effects; filled epoxy resins; filler concentration; inorganic silica particle fillers; mechanical behaviour; mechanical shocks; moisture protection; moulding compounds; processing aids; product failure; reaction shrinkage; residual stresses; temperature dependent constitutive modeling; thermal shrinkage; thermomechanical reliability; time dependent constitutive modeling; viscoelastic behaviour; Carbon compounds; Electric shock; Electronic components; Encapsulation; Epoxy resins; Moisture; Protection; Silicon compounds; Temperature dependence; Viscosity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, 2004. EuroSimE 2004. Proceedings of the 5th International Conference on
Print_ISBN :
0-7803-8420-2
Type :
conf
DOI :
10.1109/ESIME.2004.1304095
Filename :
1304095
Link To Document :
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