• DocumentCode
    3056714
  • Title

    Simulation of no-flow underfill process for flip-chip assembly

  • Author

    Kolbeck, A. ; Hauck, T. ; Jendrny, J. ; Hahn, O. ; Lang, S.

  • Author_Institution
    Motorola GmbH, Munich, Germany
  • fYear
    2004
  • fDate
    2004
  • Firstpage
    587
  • Lastpage
    592
  • Abstract
    The no-flow underfill process and materials were investigated for flip-chip interconnects in active components for the automotive market. The desired mechanical reliability of these components requires an underfill process in order to reinforce the flip-chip interconnects. The conventional underfill process uses epoxy resins that are dispensed after solder bump reflow. Capillary effects force the resin to flow underneath the chip and to fill the gap between chip and chip carrier. The resin is then cured in a heating operation. No-flow underfill materials do not require subsequent reflow, dispense and cure processes. They are applied prior to chip attachment, act as fluxing agent for the solder reflow and form a solid during reflow cycle that reinforces the interconnects. This process provides significant cost savings as it reduces the number of process steps and increases the throughput. However, it requires a well-optimised set of process parameters. The curing procedure of the resin is very different from that of the conventional capillary flow applications. A good understanding of the reaction kinetics of the resin is required in order to get a high assembly yield and reliable interconnects. Motorola recently completed an extensive study of the no-flow underfill process and materials. Results of this study are presented, such as differential scanning calorimeter (DSC) tests, thermal simulations of the cure process under different conditions, assembly experiments and accelerated fatigue tests of flip-chip interconnects.
  • Keywords
    circuit simulation; curing; differential scanning calorimetry; encapsulation; failure analysis; fatigue testing; flip-chip devices; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; life testing; microassembling; plastic packaging; reaction kinetics; reflow soldering; thermal analysis; thermal stresses; DSC; accelerated fatigue tests; assembly; assembly yield; automotive market; capillary effects; capillary flow applications; chip carrier; cure process thermal simulations; differential scanning calorimeter tests; epoxy resins; flip-chip assembly; flip-chip interconnects; fluxing agent action; gap filling; mechanical reliability; no-flow underfill materials; no-flow underfill process simulation; process steps; process throughput; reaction kinetics; reliable interconnects; resin curing; solder bump reflow; solder reflow cycle; Assembly; Automotive engineering; Costs; Curing; Epoxy resins; Heating; Kinetic theory; Solids; Testing; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, 2004. EuroSimE 2004. Proceedings of the 5th International Conference on
  • Print_ISBN
    0-7803-8420-2
  • Type

    conf

  • DOI
    10.1109/ESIME.2004.1304096
  • Filename
    1304096