DocumentCode
3056854
Title
From chemical building blocks of polymers to microelectronics reliability
Author
Bressers, H.J.L. ; van Driel, W.D. ; Jansen, K.M.B. ; Ernst, L.J. ; Zhang, G.Q.
Author_Institution
ATO Innovation/Philips Semicond., Nijmegen, Netherlands
fYear
2004
fDate
2004
Firstpage
621
Lastpage
625
Abstract
Among various materials, polymers are widely used in microelectronics as different product constituents, such as encapsulants, conductive or non-conductive adhesives, underfills, molding compounds, insulators, dielectrics, and coatings. The behavior of these polymer constituents determines the performance, such as functionality and reliability, of the final products. Therefore, the successful development of microelectronics depends on, to some extent, the optimal design and processing of polymer materials. Due to the development trends of microelectronics, characterized mainly by ongoing miniaturization down to the nano scale, technology and functionality integration, eco-designing, shorter-time-to-market, development and application of polymers become one of the bottlenecks for the microelectronic industry. Aiming at optimizing the product/process development, much effort is directed to understanding and designing polymer behavior in microelectronics, such as in material pre-selection, processing, characterization and modeling. Although these efforts are necessary, the ultimate benefits can only be realized if the relationship between chemistry and the behavior can be understood and predicted. This paper presents some results of our effort to establish the links between chemical details of the polymers and microelectronics reliability.
Keywords
adhesives; conducting polymers; dielectric thin films; encapsulation; insulating thin films; integrated circuit design; integrated circuit packaging; integrated circuit reliability; moulding; plastic packaging; polymer films; product development; chemical building blocks; coatings; conductive adhesives; development trends; dielectrics; eco-designing; encapsulants; functionality integration; insulators; material characterization; material chemistry; material modeling; material pre-selection; material processing; microelectronics reliability; molding compounds; nanoscale miniaturization; nonconductive adhesives; optimal design; optimal processing; polymer behavior; polymer constituents; polymer materials; process development; product constituents; product development; product functionality; product reliability; technology integration; time-to-market; underfills; Chemicals; Coatings; Conducting materials; Dielectric materials; Dielectrics and electrical insulation; Microelectronics; Nonconductive adhesives; Plastic insulation; Polymer films; Process design;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, 2004. EuroSimE 2004. Proceedings of the 5th International Conference on
Print_ISBN
0-7803-8420-2
Type
conf
DOI
10.1109/ESIME.2004.1304101
Filename
1304101
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