DocumentCode :
3057148
Title :
Science underpinning the quality of transfer printing
Author :
Li, Teng ; Tucker, Matthew B.
fYear :
2009
fDate :
9-11 Dec. 2009
Firstpage :
1
Lastpage :
2
Abstract :
In this paper, we aim to reveal the mechanisms that underpin the quality of transfer printing via a comprehensive computational modeling. The outcome of this study is a quality map of transfer printing, which can offer vital guidance for the structural design, defect control and materials selection of flexible devices to be fabricated via transfer printing.
Keywords :
delamination; nanofabrication; comprehensive computational modeling; transfer printing; Adhesives; Assembly; Computational modeling; Delamination; Educational institutions; Fabrication; Nanofabrication; Nanoscale devices; Printing; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium, 2009. ISDRS '09. International
Conference_Location :
College Park, MD
Print_ISBN :
978-1-4244-6030-4
Electronic_ISBN :
978-1-4244-6031-1
Type :
conf
DOI :
10.1109/ISDRS.2009.5378158
Filename :
5378158
Link To Document :
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