Title :
A method for multiple fault diagnosis in analog circuits
Author :
Starzyk, Janusz A. ; Liu, D.
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Ohio Univ., Athens, OH, USA
Abstract :
Fault diagnosis of analog circuits is essential for analog and mixed-signal circuits testing and maintenance. A method for multiple fault diagnosis in linear analog circuits is proposed based on the large change sensitivity analysis and ambiguity group locating technique. A test equation establishes the relationship between the measured responses and deviations of faulty parameters. Multiple excitations and corresponding measurements are required for fault location. The parameter evaluation can provide the exact parameter solutions. The faulty parameter deviations can be between zero and infinity. The proposed method is extremely effective for the circuit with very limited accessible nodes and is also computationally efficient
Keywords :
analogue integrated circuits; fault diagnosis; fault location; integrated circuit testing; mixed analogue-digital integrated circuits; ambiguity group locating technique; large change sensitivity analysis; linear analog circuits; multiple excitations; multiple fault diagnosis; test equation; Analog circuits; Circuit faults; Circuit testing; Computer science; Electrical fault detection; Equations; Fault diagnosis; Fault location; H infinity control; Sensitivity analysis;
Conference_Titel :
System Theory, 2001. Proceedings of the 33rd Southeastern Symposium on
Conference_Location :
Athens, OH
Print_ISBN :
0-7803-6661-1
DOI :
10.1109/SSST.2001.918492
