DC-to-mm-wave absolute potential measurements inside digital microwave ICs using a micromachined photoconductive sampling probe

Author

David, G. ; Whitaker, J.F. ; Weatherford, T.R. ; Jobe, K. ; Meyer, S. ; Bustamante, M. ; Goyette, W. ; Thomas, S. ; Elliott, K.

Author_Institution

Center for Ultrafast Opt. Sci., Michigan Univ., Ann Arbor, MI, USA

Volume

3

fYear

1998

fDate

7-12 June 1998

Firstpage

1333

Abstract

A micromachined photoconductive sampling probe is used to determine detailed wave forms at different circuit nodes and corresponding propagation delays from within an InP HBT frequency divider operating at 2.7 GHz. The results demonstrate for the first time the capability of photoconductive probes for absolute-voltage, DC-coupled potential measurements in integrated circuits.

Keywords

III-V semiconductors; bipolar digital integrated circuits; frequency dividers; heterojunction bipolar transistors; indium compounds; integrated circuit measurement; micromachining; microwave frequency convertors; microwave integrated circuits; microwave measurement; photoconducting devices; voltage measurement; 2.7 GHz; DC-to-MM-wave absolute potential measurement; InP; InP HBT frequency divider; circuit node; digital microwave IC; micromachined photoconductive sampling probe; propagation delay; wave form; Aerospace electronics; Circuits; Microwave measurements; Optical sensors; Photoconducting devices; Photoconductivity; Probes; Sampling methods; Spatial resolution; Ultrafast optics;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1998 IEEE MTT-S International

Conference_Location

Baltimore, MD, USA

ISSN

0149-645X

Print_ISBN

0-7803-4471-5

Type

conf

DOI

10.1109/MWSYM.1998.700620

Filename

700620