Title :
A Clock Fault Detection Circuit for Reliable High Speed System by Time-to-Voltage Conversion
Author_Institution :
Coll. of Inf. & Electron. Eng., Zhejiang Gongshang Univ., Hangzhou, China
Abstract :
A novel architecture for clock fault detection circuit for high speed nanoelectronics system is delivered. Time-to-voltage converter is employed for transforming error of time to the error of voltage which is more convenient for error detection. The rapid discharging circuit is also used for system resetting. To illustrate the detection capability by the diction circuit, a prototype CMOS design of this proposed circuit is presented. Simulation result shows that the proposed architecture is very suit for integration to nanoelectronic circuit design to detect the fault of the clock.
Keywords :
CMOS integrated circuits; circuit simulation; clocks; failure analysis; fault diagnosis; integrated circuit design; nanoelectronics; reliability; clock fault detection circuit; error detection; high speed nanoelectronic system; nanoelectronic circuit design; prototype CMOS design; rapid discharging circuit; reliable high speed system; time error; time-to-voltage conversion; voltage error; Circuit faults; Clocks; Computer architecture; Electrical fault detection; Fault detection; Jitter; Phase locked loops; Prototypes; Space vector pulse width modulation; Voltage; clock fault; fault detection; fault tolerance; time-to-voltage;
Conference_Titel :
Electronic Commerce and Security, 2009. ISECS '09. Second International Symposium on
Conference_Location :
Nanchang
Print_ISBN :
978-0-7695-3643-9
DOI :
10.1109/ISECS.2009.208
