• DocumentCode
    3057660
  • Title

    Electronics for the post-silicon CMOS era…challenges and opportunities

  • Author

    Ghosh, A.

  • Author_Institution
    Charles L. Brown Sch. of Electr. & Comput. Eng., Univ. of Virginia, Charlottesville, VA, USA
  • fYear
    2009
  • fDate
    9-11 Dec. 2009
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given: As we try to extend silicon-based CMOS devices towards end of the ITRS roadmap and beyond, we are confronted with several challenges that need to be mitigated with clever design, modeling and experimentation - challenges arising from electrostatic effects such as diminishing gate control, quantum effects such as tunneling and interfering waves, atomistic effects such as dopant fluctuations, many-body effects such as strong Coulomb blockade and temporal effects such as low frequency noise from traps and defects. I will discuss some routes towards a postCMOS switch the device and circuit-level possibilities arising from new materials such as organic molecules and graphene nanoribbons, as well as novel principles such as mechanical switching, non-equilibrium switching and spintronic switching.
  • Keywords
    CMOS integrated circuits; Coulomb blockade; electrostatics; graphene; magnetoelectronics; molecular electronics; nanoelectronics; nanostructured materials; technological forecasting; tunnelling; Coulomb Blockade; ITRS roadmap; atomistic effects; defects; diminishing gate control; dopant fluctuations; electrostatic effects; graphene nanoribbons; interfering waves; low frequency noise; many-body effects; mechanical switching; nonequilibrium switching; organic molecules; post-CMOS switch; quantum effects; silicon-based CMOS devices; spintronic switching; temporal effects; traps; tunneling; Electrostatics; Fluctuations; Low-frequency noise; Nanoscale devices; Organic materials; Semiconductor device modeling; Semiconductor process modeling; Switches; Switching circuits; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2009. ISDRS '09. International
  • Conference_Location
    College Park, MD
  • Print_ISBN
    978-1-4244-6030-4
  • Electronic_ISBN
    978-1-4244-6031-1
  • Type

    conf

  • DOI
    10.1109/ISDRS.2009.5378175
  • Filename
    5378175