Title :
Statistical approach to clustering in pattern recognition
Author :
Zeng, Yujing ; Starzyk, Janusz
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Ohio Univ., Athens, OH, USA
Abstract :
Clustering is a typical method of grouping data points in an unsupervised learning environment. The performance of most clustering algorithms is dependent on the accurate estimate of the cluster number, which is always unknown in the real applications. We propose a parametric approach, which starts with an estimate of the local distribution and efficiently avoids pre-assuming the cluster number. This clustering program is applied to both artificial and benchmark data classification and its performance is proven better than the well-known k-means algorithm
Keywords :
Gaussian distribution; pattern clustering; unsupervised learning; clustering algorithms; k-means algorithm; local distribution; parametric approach; pattern recognition; statistical approach; unsupervised learning environment; Clustering algorithms; Data analysis; Data structures; Merging; Nearest neighbor searches; Optimization methods; Pattern recognition; Probability distribution; Simulated annealing; Unsupervised learning;
Conference_Titel :
System Theory, 2001. Proceedings of the 33rd Southeastern Symposium on
Conference_Location :
Athens, OH
Print_ISBN :
0-7803-6661-1
DOI :
10.1109/SSST.2001.918513