Ultra-thin metallic layers studied by broadband terahertz time-domain spectroscopy

Author

Kroll, J. ; Darmo, J. ; Unterrainer, K.

Author_Institution

Inst. for Photonics, Vienna Univ. of Technol., Austria

fYear

2004

fDate

27 Sept.-1 Oct. 2004

Firstpage

465

Lastpage

466

Abstract

We report on the optical properties of ultra thin metallic layers in the frequency range of 0.1-5 THz. Such layers show unusual properties compared to the bulk material which are successfully exploited in new application fields such as THz optics. The measured properties of ultra-thin metallic layers made by chromium in the frequency from 0.2 to 5 THz is presented. The decreased amplitude of the reflected THz pulses has been exploited as a metallic anti-reflection coating for electro-optic gallium phosphide sensor which improved the gained signal quality.

Keywords

III-V semiconductors; antireflection coatings; chromium; electrical resistivity; electro-optical devices; gallium compounds; metallic thin films; optical films; optical sensors; refractive index; submillimetre wave spectra; 0.1 to 5 THz; Cr; GaP; THz optics; broadband terahertz time domain spectroscopy; chromium; electrooptic gallium phosphide sensor; metallic antireflection coating; optical properties; reflected THz pulses; ultra thin metallic layers; Chromium; Coatings; Electrooptic devices; Frequency measurement; Gallium compounds; Optical materials; Optical pulses; Optical sensors; Spectroscopy; Time domain analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared and Millimeter Waves, 2004 and 12th International Conference on Terahertz Electronics, 2004. Conference Digest of the 2004 Joint 29th International Conference on

Print_ISBN

0-7803-8490-3

Type

conf

DOI

10.1109/ICIMW.2004.1422165

Filename

1422165