Title :
Ultra-thin metallic layers studied by broadband terahertz time-domain spectroscopy
Author :
Kroll, J. ; Darmo, J. ; Unterrainer, K.
Author_Institution :
Inst. for Photonics, Vienna Univ. of Technol., Austria
fDate :
27 Sept.-1 Oct. 2004
Abstract :
We report on the optical properties of ultra thin metallic layers in the frequency range of 0.1-5 THz. Such layers show unusual properties compared to the bulk material which are successfully exploited in new application fields such as THz optics. The measured properties of ultra-thin metallic layers made by chromium in the frequency from 0.2 to 5 THz is presented. The decreased amplitude of the reflected THz pulses has been exploited as a metallic anti-reflection coating for electro-optic gallium phosphide sensor which improved the gained signal quality.
Keywords :
III-V semiconductors; antireflection coatings; chromium; electrical resistivity; electro-optical devices; gallium compounds; metallic thin films; optical films; optical sensors; refractive index; submillimetre wave spectra; 0.1 to 5 THz; Cr; GaP; THz optics; broadband terahertz time domain spectroscopy; chromium; electrooptic gallium phosphide sensor; metallic antireflection coating; optical properties; reflected THz pulses; ultra thin metallic layers; Chromium; Coatings; Electrooptic devices; Frequency measurement; Gallium compounds; Optical materials; Optical pulses; Optical sensors; Spectroscopy; Time domain analysis;
Conference_Titel :
Infrared and Millimeter Waves, 2004 and 12th International Conference on Terahertz Electronics, 2004. Conference Digest of the 2004 Joint 29th International Conference on
Print_ISBN :
0-7803-8490-3
DOI :
10.1109/ICIMW.2004.1422165
