Title :
Fault-tolerance in FFT arrays: time-redundancy approaches
Author :
Antola, A. ; Negrini, R. ; Sami, M.G. ; Scarabottolo, N.
Author_Institution :
Dept. of Electron., Politecnico di Milano, Italy
Abstract :
Time redundancy is suggested as a viable solution for the two-dimensional fast Fourier transform (FFT) array directly corresponding to the FFT flow graph. Two approaches are presented, one based on interstage reconfiguration and the other on intrastage reconfiguration, both allowing for survival to multiple faults with limited increase of network complexity and very small hard-core sections. With both approaches, the processing speed in the presence of faults is halved with respect to the nominal speed. Reliability and survival ratios to multiple faults are evaluated for the two cases, taking into account the area increments necessary for fault tolerance
Keywords :
directed graphs; fast Fourier transforms; fault tolerant computing; redundancy; FFT arrays; FFT flow graph; VLSI; WSI; fault tolerance; interstage reconfiguration; intrastage reconfiguration; processing speed; survival ratios; time redundancy; two-dimensional fast Fourier transform; Circuit faults; Fault tolerance; Flexible printed circuits; Phased arrays; Production; Redundancy; Runtime; Signal processing algorithms; Silicon; Very large scale integration;
Conference_Titel :
Communications, 1990. ICC '90, Including Supercomm Technical Sessions. SUPERCOMM/ICC '90. Conference Record., IEEE International Conference on
Conference_Location :
Atlanta, GA
DOI :
10.1109/ICC.1990.117182