Title :
Elimination of skilled forgeries in off-line systems: a breakthrough
fDate :
30 Aug-3 Sep 1992
Abstract :
Presents a novel approach to automatic verification of signatures in off-line systems. This new approach is able to eliminate skilled forgeries at a very low false alarm rate. A zero false alarm rate is also possible at a very high correct rejection, and the average error rate has approached 2% for skilled forgeries. The new approach is based on matching the suspect signature with reference knowledge (RN) represented by a reference image (RI) constructed from all the available training samples. A set of newly developed global and local features, extracted using a new matching technique called Ammar matching technique (AMT), are used
Keywords :
Algorithm design and analysis; Area measurement; Coordinate measuring machines; Databases; Forgery; Gravity; Physics computing; Robustness; Samarium; Time measurement;
Conference_Titel :
Pattern Recognition, 1992. Vol.II. Conference B: Pattern Recognition Methodology and Systems, Proceedings., 11th IAPR International Conference on
Conference_Location :
The Hague
Print_ISBN :
0-8186-2915-0
DOI :
10.1109/ICPR.1992.201806