Title :
AlGaN-based deep-UV LEDs fabricated on connected-pillar AlN buffer
Author :
Hirayama, Hiroshi ; Tomita, Yasumoto ; Toyoda, Seiji ; Fujikawa, S. ; Kamata, N.
Author_Institution :
RIKEN (The Inst. of Phys. & Chem. Res.), Wako, Japan
fDate :
June 30 2013-July 4 2013
Abstract :
260 nm-band AlGaN deep-ultraviolet (DUV) light-emitting diodes (LED) was fabricated on a connected-pillar AlN buffer layer grown on a sapphire substrate. Low threading dislocation density (TDD) connected-pillar AlN buffer is considered to be quite effective for obtaining high internal quantum efficiency (IQE) and light-extraction efficiency (LEE) in DUV-LEDs. We fabricated an AlN pillar array structure with accurate hexagonal shape pillars grown on a patterned sapphire substrate (PSS) by using an NH3 pulsed flow multi-layer (ML) growth and an epitaxial lateral overgrowth (ELO). The AlN pillars were connected to be flat surface AlN buffer layer with low TDD, through ELO process. We fabricated AlGaN quantum well (QW) DUV-LED on a connected-pillar AlN buffer. The output power obtained was 5.5 mW for 265 nm LED measured under room temperature cw operation.
Keywords :
III-V semiconductors; aluminium compounds; buffer layers; dislocation density; gallium compounds; light emitting diodes; semiconductor growth; semiconductor quantum wells; ultraviolet sources; wide band gap semiconductors; Al2O3; AlGaN quantum well; AlGaN-AlN-Al2O3; AlGaN-based deep-UV LED; AlN buffer layer; ELO; IQE; LEE; ML growth; PSS; TDD; connected-pillar AlN buffer; deep-ultraviolet light emitting diodes; epitaxial lateral overgrowth; hexagonal shape pillars; internal quantum efficiency; light extraction efficiency; patterned sapphire substrate; power 5.5 mW; pulsed flow multilayer growth; temperature 293 K to 298 K; threading dislocation density; wavelength 260 nm; wavelength 265 nm; Aluminum gallium nitride; Arrays; III-V semiconductor materials; Light emitting diodes; Scanning electron microscopy; Surface emitting lasers; Temperature measurement;
Conference_Titel :
Lasers and Electro-Optics Pacific Rim (CLEO-PR), 2013 Conference on
Conference_Location :
Kyoto
DOI :
10.1109/CLEOPR.2013.6600208