DocumentCode :
3059270
Title :
ECT image analysis applying an inverse problem algorithm with Tikhonov/TV Regularization
Author :
Pasadas, Dario ; Lopes Ribeiro, A. ; Ramos, Helena ; Rocha, Tiago
Author_Institution :
Inst. de Telecomun., Univ. de Lisboa, Lisbon, Portugal
fYear :
2015
fDate :
11-14 May 2015
Firstpage :
940
Lastpage :
944
Abstract :
Eddy current testing is used to inspect and analyze potential defects in metallic structures that can damage its future usefulness. However, this technique still needs to be improved. In this paper, a probe including one planar coil, one GMR sensor and a tiny permanent magnet is attached to a two dimension positioning system to evaluate a metallic plate with a linear defect. A magnetic field perturbation around the defect is measured and image processing techniques, in conjunction with an inverse problem algorithm, are used to obtain the eddy current density present in the metallic surface. From the eddy current map it is possible to determine the geometrical characteristics of the defect. To apply the inverse problem algorithm, regularization to suppress noise and to overcome instability effects are required. In this paper, Tikhonov and Total Variation Regularization are compared regarding their performance and obtained results.
Keywords :
eddy current testing; plates (structures); surface structure; variational techniques; ECT image; Eddy current density; Eddy current testing; GMR sensor; Tikhonov-TV regularization; Tikhonov-total variation regularization; geometrical characteristics; image processing; instability effects; inverse problem algorithm; magnetic field perturbation; metallic plate; metallic structures; planar coil; tiny permanent magnet; two dimension positioning system; Current measurement; Eddy currents; Inverse problems; Magnetic fields; Magnetic sensors; Signal processing algorithms; TV; GMR sensor; Tikhonov regularization; eddy current testing; inverse problem; planar coil; total variation regularization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
Conference_Location :
Pisa
Type :
conf
DOI :
10.1109/I2MTC.2015.7151396
Filename :
7151396
Link To Document :
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