Title :
Impact Analysis of Configuration Changes for Test Case Selection
Author :
Qu, Xiao ; Acharya, Mithun ; Robinson, Brian
Author_Institution :
Ind. Software Syst., ABB Corp. Res., Raleigh, NC, USA
fDate :
Nov. 29 2011-Dec. 2 2011
Abstract :
Testing configurable systems, which are becoming prevalent, is expensive due to the large number of configurations and test cases. Existing approaches reduce this expense by selecting or prioritizing configurations. However, these approaches redundantly run the full test suite for the selected configurations. To address this redundancy, we propose a test case selection approach by analyzing the impact of configuration changes with static program slicing. Given an existing test suite T used for testing a system S under a configuration C, our approach decides for each t in T if t has to be used for testing S under a different configuration C´. We have evaluated our approach on a large industrial system within ABB with promising results.
Keywords :
program slicing; program testing; configurable system testing; configuration changes; impact analysis; static program slicing; test case selection; Approximation methods; Data structures; Equations; Google; Safety; Switches; Testing; configuration testing; program slicing; static impact analysis; test case selection;
Conference_Titel :
Software Reliability Engineering (ISSRE), 2011 IEEE 22nd International Symposium on
Conference_Location :
Hiroshima
Print_ISBN :
978-1-4577-2060-4
DOI :
10.1109/ISSRE.2011.9