• DocumentCode
    3059440
  • Title

    An Empirical Study of JUnit Test-Suite Reduction

  • Author

    Zhang, Lingming ; Marinov, Darko ; Zhang, Lu ; Khurshid, Sarfraz

  • Author_Institution
    Electr. & Comput. Eng., Univ. of Texas at Austin, Austin, TX, USA
  • fYear
    2011
  • fDate
    Nov. 29 2011-Dec. 2 2011
  • Firstpage
    170
  • Lastpage
    179
  • Abstract
    As test suites grow larger during software evolution, regression testing becomes expensive. To reduce the cost of regression testing, test-suite reduction aims to select a minimal subset of the original test suite that can still satisfy all the test requirements. While traditional test-suite reduction techniques were intensively studied on C programs with specially generated test suites, there are limited studies for test-suite reduction on programs with real-world test suites. In this paper, we investigate test-suite reduction techniques on Java programs with real-world JUnit test suites. We implemented four representative test-suite reduction techniques for JUnit test suites. We performed an empirical study on 19 versions of four real-world Java programs, ranging from 1.89 KLoC to 80.44 KLoC. Our study investigates both the benefits and the costs of test-suite reduction. The results show that the four traditional test-suite reduction techniques can effectively reduce these JUnit test suites without substantially reducing their fault-detection capability. Based on the results, we provide a guideline for achieving cost-effective JUnit test suite reduction.
  • Keywords
    Java; program testing; regression analysis; JUnit test suites; cost effective JUnit test suite reduction technique; cost reduction; minimal subset; real-world Java programs; regression testing; software evolution; test requirements; Complexity theory; Instruments; Java; Measurement; Radio frequency; Software; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering (ISSRE), 2011 IEEE 22nd International Symposium on
  • Conference_Location
    Hiroshima
  • ISSN
    1071-9458
  • Print_ISBN
    978-1-4577-2060-4
  • Type

    conf

  • DOI
    10.1109/ISSRE.2011.26
  • Filename
    6132965