Title : 
An Empirical Study of JUnit Test-Suite Reduction
         
        
            Author : 
Zhang, Lingming ; Marinov, Darko ; Zhang, Lu ; Khurshid, Sarfraz
         
        
            Author_Institution : 
Electr. & Comput. Eng., Univ. of Texas at Austin, Austin, TX, USA
         
        
        
            fDate : 
Nov. 29 2011-Dec. 2 2011
         
        
        
        
            Abstract : 
As test suites grow larger during software evolution, regression testing becomes expensive. To reduce the cost of regression testing, test-suite reduction aims to select a minimal subset of the original test suite that can still satisfy all the test requirements. While traditional test-suite reduction techniques were intensively studied on C programs with specially generated test suites, there are limited studies for test-suite reduction on programs with real-world test suites. In this paper, we investigate test-suite reduction techniques on Java programs with real-world JUnit test suites. We implemented four representative test-suite reduction techniques for JUnit test suites. We performed an empirical study on 19 versions of four real-world Java programs, ranging from 1.89 KLoC to 80.44 KLoC. Our study investigates both the benefits and the costs of test-suite reduction. The results show that the four traditional test-suite reduction techniques can effectively reduce these JUnit test suites without substantially reducing their fault-detection capability. Based on the results, we provide a guideline for achieving cost-effective JUnit test suite reduction.
         
        
            Keywords : 
Java; program testing; regression analysis; JUnit test suites; cost effective JUnit test suite reduction technique; cost reduction; minimal subset; real-world Java programs; regression testing; software evolution; test requirements; Complexity theory; Instruments; Java; Measurement; Radio frequency; Software; Testing;
         
        
        
        
            Conference_Titel : 
Software Reliability Engineering (ISSRE), 2011 IEEE 22nd International Symposium on
         
        
            Conference_Location : 
Hiroshima
         
        
        
            Print_ISBN : 
978-1-4577-2060-4
         
        
        
            DOI : 
10.1109/ISSRE.2011.26