Title :
Partially prism-gridded FDTD analysis for layered structures of transversely curved boundary
Author :
Chieh-Tsao Hwang ; Ruey-Beei Wu
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
A partially prism-gridded FDTD analysis is presented to deal with layered structures with curved boundary in transverse directions. It is applied to calculate the scattering parameters of vias in multilayer packaging. The good agreement of the results with those by other methods verifies the accuracy of this analysis.
Keywords :
S-parameters; finite difference time-domain analysis; packaging; layered structures; multilayer packaging vias; partially prism-gridded FDTD analysis; scattering parameters; transversely curved boundary; Degradation; Electromagnetic scattering; Finite difference methods; Finite element methods; Geometry; Nonhomogeneous media; Packaging; Solid modeling; Testing; Time domain analysis;
Conference_Titel :
Microwave Symposium Digest, 1998 IEEE MTT-S International
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-4471-5
DOI :
10.1109/MWSYM.1998.700640
