• DocumentCode
    3060026
  • Title

    In-flight Heading Estimation of Strapdown Magnetometers using Particle Filters

  • Author

    Koo, Wonmo ; Chun, Sebum ; Sung, Sangkyung ; Lee, Young Jae ; Kang, Taesam

  • Author_Institution
    Dept. of Aerosp. Inf. Eng., Konkuk Univ., Seoul, South Korea
  • fYear
    2008
  • fDate
    16-18 July 2008
  • Firstpage
    379
  • Lastpage
    384
  • Abstract
    This paper presents a real-time heading estimation algorithm using IMU and strapdown magnetometer without any other external heading reference. To calibrate the magnetic deviation, sensor errors caused by hard iron effect and initial heading of strapdown magnetometers are considered. In our approach, sensor output distortion due to the soft iron effect is ignored, which is relatively small. First, for the estimation of heading angle, system and measurement model is derived, which is nonlinear. Then particle filter and extended Kalman filter is introduced for performance comparison. The proposed algorithm for the integration of IMU and magnetometer is verified via numerical simulation in Matlab. Simulation result demonstrates accurate heading estimation error within 1 degree for both algorithms when there exists small initial heading error and hard iron effect, yet particle filter provides more robust and precise result than the extended Kalman filter in case the initial heading error and biases are large.
  • Keywords
    Kalman filters; magnetic fields; magnetometers; nonlinear filters; particle filtering (numerical methods); Matlab; extended Kalman filter; in-flight heading estimation; magnetic deviation; particle filters; real-time heading estimation; sensor errors; soft iron effect; strapdown magnetometers; Distortion measurement; Goniometers; Iron; Magnetic sensors; Magnetic separation; Magnetometers; Mathematical model; Nonlinear distortion; Numerical simulation; Particle filters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 2008. NAECON 2008. IEEE National
  • Conference_Location
    Dayton, OH
  • ISSN
    7964-0977
  • Print_ISBN
    978-1-4244-2615-7
  • Electronic_ISBN
    7964-0977
  • Type

    conf

  • DOI
    10.1109/NAECON.2008.4806576
  • Filename
    4806576