Title :
Accuracy of lumped-element calibrations for four-sampler vector network analyzers
Author :
Marks, R.B. ; Jargon, J.A. ; Rytting, D.K.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
Several lumped-element calibrations have been proposed for four-sampler vector network analyzers. This paper offers the first assessment of their accuracy in the face of imperfectly defined standards. We discover significant error and introduce a new calibration that offers demonstrably improved accuracy.
Keywords :
calibration; lumped parameter networks; network analysers; SOLT; four-sampler vector network analyzer; lumped-element calibration; Calibration; Government; Measurement errors; Measurement standards; NIST; Postal services; Proposals; Reflection; Robustness; Test equipment;
Conference_Titel :
Microwave Symposium Digest, 1998 IEEE MTT-S International
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-4471-5
DOI :
10.1109/MWSYM.1998.700656
