• DocumentCode
    3060173
  • Title

    Analysis of conducted EMI emissions from PWM inverter based on empirical models and comparative experiments

  • Author

    Zhu, Huibin ; Lai, Jih-Sheng ; Hefner, Allen R., Jr. ; Tang, Yuqing ; Chen, Chingchi

  • Author_Institution
    Center for Power Electron. Syst., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    2
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    861
  • Abstract
    For the purpose of investigation of electromagnetic interference (EMI) mechanisms in a PWM inverter, empirical models and comparative experiments were studied in both time-domain and frequency domain. Models of the major circuit components including switching devices, passive components and interconnects were obtained with physics-based device modeling and time-domain reflectometry (TDR) for parasitics characterization. A full-bridge inverter was then constructed with all empirical models included to study the fundamental mechanisms by which the EMI noises are excited and propagated. With separation of common- and differential-mode EMIs, the simulation results were compared with actual experiments to examine the significant roles of parasitic elements coupled with device switching dynamics in EMI generations
  • Keywords
    PWM invertors; bridge circuits; electromagnetic interference; frequency-domain analysis; switching circuits; time-domain analysis; time-domain reflectometry; EMI noises; PWM inverter; common-mode EMI; conducted EMI emissions; device switching dynamics; differential-mode EMI; electromagnetic interference; empirical models; frequency domain; full-bridge inverter; interconnects; major circuit components; parasitics characterization; passive components; physics-based device modeling; switching devices; time-domain; time-domain reflectometry; AC motors; Circuit noise; Electromagnetic interference; Electromagnetic modeling; Insulated gate bipolar transistors; Power system modeling; Pulse width modulation; Pulse width modulation inverters; Semiconductor device noise; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialists Conference, 1999. PESC 99. 30th Annual IEEE
  • Conference_Location
    Charleston, SC
  • ISSN
    0275-9306
  • Print_ISBN
    0-7803-5421-4
  • Type

    conf

  • DOI
    10.1109/PESC.1999.785612
  • Filename
    785612