Title :
A Dependability Case Editor with Pattern Library
Author :
Matsuno, Yutaka ; Takamura, Hiroki ; Ishikawa, Yutaka
Author_Institution :
Inf. Technol. Center, Univ. of Tokyo, Tokyo, Japan
Abstract :
This abstract discusses our current work on the collection of patterns of dependability cases for a software/system lifecycle. We also describe a prototype implementation of a dependability case editor called D-Case Editor, which has a pattern selection function.
Keywords :
software libraries; software reliability; D-Case Editor; dependability case editor; dependability case pattern; pattern library; pattern selection function; software lifecycle; system lifecycle; Availability; Force; Libraries; Robots; Safety; Security; Software; assurance cases; dependability;
Conference_Titel :
High-Assurance Systems Engineering (HASE), 2010 IEEE 12th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-9091-2
Electronic_ISBN :
1530-2059
DOI :
10.1109/HASE.2010.26