Fault location for teed circuits with mutually coupled lines and series capacitors

Author

Evrenosoglu, Cansin Y. ; Abur, Ali

Author_Institution

Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA

Volume

3

fYear

2003

fDate

23-26 June 2003

Abstract

This paper investigates the problem of fault location in teed circuits. Previous work presented in C.Y. Evrenssoglu and A. Abur (Oct. 200), has successfully extended the discrete wavelet transform (DWT) based fault location technique of F.H. Magnago and A. Abur (Oct. 1998) to the case of teed circuits. In this paper, additional challenges introduced in the presence of MOV protected series capacitors and/or mutually coupled line sections in teed circuits are addressed. DWT based fault location procedures are developed and tested for these special cases. Fault signals simulated by ATP are used to validate the new fault location procedure under various scenarios.

Keywords

capacitors; discrete wavelet transforms; fault location; power transmission faults; power transmission lines; varistors; ATP; DWT; discrete wavelet transform; fault location; metal oxide varistors; series capacitors; teed circuits; Capacitors; Circuit faults; Coupling circuits; Discrete wavelet transforms; Fault location; Iterative algorithms; Mutual coupling; Nonlinear equations; Power transmission lines; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Power Tech Conference Proceedings, 2003 IEEE Bologna

Print_ISBN

0-7803-7967-5

Type

conf

DOI

10.1109/PTC.2003.1304370

Filename

1304370