Title :
Estimating Software Intensity Function via Multiscale Analysis and Its Application to Reliability Assessment
Author :
Xiao, Xiao ; Dohi, Tadashi
Author_Institution :
Dept. of Inf. Eng., Hiroshima Univ., Higashi-Hiroshima, Japan
Abstract :
Since software fault detection process is well-modeled by a non-homogeneous Poisson process, it is of great interest to estimate accurately the intensity function from observed software-fault data. In the existing work the same authors introduced the wavelet-based techniques for this problem and found that the Haar wavelet transform provided a very powerful performance in estimating software intensity function. In this paper, we also study the Haar-wavelet-transform-based approach to be investigated from the point of view of multiscale analysis. More specifically, a Bayesian multiscale intensity estimation algorithm is employed. In numerical study with real software-fault count data, we compare the Bayesian multiscale intensity estimation with the existing non-Bayesian wavelet-based estimation as well as the conventional maximum likelihood estimation method and least squares estimation method.
Keywords :
Bayes methods; Haar transforms; least mean squares methods; maximum likelihood estimation; software fault tolerance; stochastic processes; wavelet transforms; Bayesian multiscale intensity estimation; Haar wavelet transform; least squares estimation method; maximum likelihood estimation; multiscale analysis; non Bayesian wavelet based estimation; nonhomogeneous Poisson process; software fault detection; software intensity function estimation; software reliability assessment; Bayesian methods; Mathematical model; Maximum likelihood estimation; Software; Software reliability; Wavelet transforms; Bayesian approach; discrete wavelet transform; multiscale analysis; non-parametric estimation; software reliability assessment;
Conference_Titel :
Dependable Computing (PRDC), 2011 IEEE 17th Pacific Rim International Symposium on
Conference_Location :
Pasadena, CA
Print_ISBN :
978-1-4577-2005-5
Electronic_ISBN :
978-0-7695-4590-5
DOI :
10.1109/PRDC.2011.11