Title :
Performance comparison of line parametrizations
Author :
Hu, Zhanyi ; Destiné, J.
Author_Institution :
Service de Microelectron., Liege Univ., Belgium
fDate :
30 Aug-3 Sep 1992
Abstract :
The performance of the Hough transform depends on parametrization schemes as well as mapping procedures. Based on criteria such as normalized-variance and risk-ratio the authors find that normal parametrization is the best among the four frequently mentioned ones in literature, if uniform noise is present in the image space
Keywords :
Hough transforms; image processing; Hough transform; image processing; line parametrizations; mapping procedures; normal parametrization; normalized-variance; performance comparison; risk-ratio; uniform noise; Concurrent computing; Graphics; Hardware; Integrated circuit noise; Parallel processing; Pattern recognition; Risk analysis; Very large scale integration; Voting;
Conference_Titel :
Pattern Recognition, 1992. Vol.III. Conference C: Image, Speech and Signal Analysis, Proceedings., 11th IAPR International Conference on
Conference_Location :
The Hague
Print_ISBN :
0-8186-2920-7
DOI :
10.1109/ICPR.1992.201993
