DocumentCode :
3062236
Title :
A distributed measurement system for dermoscopic analysis of pigmented skin lesions
Author :
Di Leo, G. ; Paolillo, A. ; Pietrosanto, A. ; Sommella, P. ; Fabbrocini, G. ; Cacciapuoti, S.
Author_Institution :
Dept. of Ind. Eng., Univ. of Salerno, Fisciano, Italy
fYear :
2015
fDate :
11-14 May 2015
Firstpage :
1646
Lastpage :
1651
Abstract :
An image based system implementing a well-known diagnostic method is disclosed for the automatic detection of melanomas as support to clinicians. The software architecture is able to receive and store digital ELM images captured by handheld dermoscopy and smartphones, recognize automatically the skin lesion within the digital image, measure morphological and chromatic parameters, carry out a suitable classification for detecting the dermoscopic structures included in the 7-Point Checklist and finally provide a second opinion supporting the dermatologist for the clinical decision. Advanced techniques are introduced at different stages of the image processing pipeline, including the border detection, the extraction of low-level features and scoring of high order features. Performance validation of the measurement system relies to the clinical practice by physicians with different experience.
Keywords :
biomedical optical imaging; cancer; edge detection; endoscopes; feature extraction; image classification; medical image processing; skin; smart phones; automatic melanoma detection; border detection; dermoscopic analysis; digital ELM image capture; distributed measurement system; handheld dermoscopy; image classification; image processing pipeline; low-level feature extraction; pigmented skin lesion recognition; smartphones; Feature extraction; Image color analysis; Image segmentation; Lesions; Logistics; Pigmentation; Skin; Biomedical image processing; artificial intelligence; distributed measurement systems; uncertainty management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
Conference_Location :
Pisa
Type :
conf
DOI :
10.1109/I2MTC.2015.7151526
Filename :
7151526
Link To Document :
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