• DocumentCode
    3062236
  • Title

    A distributed measurement system for dermoscopic analysis of pigmented skin lesions

  • Author

    Di Leo, G. ; Paolillo, A. ; Pietrosanto, A. ; Sommella, P. ; Fabbrocini, G. ; Cacciapuoti, S.

  • Author_Institution
    Dept. of Ind. Eng., Univ. of Salerno, Fisciano, Italy
  • fYear
    2015
  • fDate
    11-14 May 2015
  • Firstpage
    1646
  • Lastpage
    1651
  • Abstract
    An image based system implementing a well-known diagnostic method is disclosed for the automatic detection of melanomas as support to clinicians. The software architecture is able to receive and store digital ELM images captured by handheld dermoscopy and smartphones, recognize automatically the skin lesion within the digital image, measure morphological and chromatic parameters, carry out a suitable classification for detecting the dermoscopic structures included in the 7-Point Checklist and finally provide a second opinion supporting the dermatologist for the clinical decision. Advanced techniques are introduced at different stages of the image processing pipeline, including the border detection, the extraction of low-level features and scoring of high order features. Performance validation of the measurement system relies to the clinical practice by physicians with different experience.
  • Keywords
    biomedical optical imaging; cancer; edge detection; endoscopes; feature extraction; image classification; medical image processing; skin; smart phones; automatic melanoma detection; border detection; dermoscopic analysis; digital ELM image capture; distributed measurement system; handheld dermoscopy; image classification; image processing pipeline; low-level feature extraction; pigmented skin lesion recognition; smartphones; Feature extraction; Image color analysis; Image segmentation; Lesions; Logistics; Pigmentation; Skin; Biomedical image processing; artificial intelligence; distributed measurement systems; uncertainty management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
  • Conference_Location
    Pisa
  • Type

    conf

  • DOI
    10.1109/I2MTC.2015.7151526
  • Filename
    7151526