Title :
One dimensional multiple scale edge detection
Author :
Chen, J.G. ; Ren, X.H. ; Tian, Q.
Author_Institution :
Comput. Center, Taiyuan Univ. of Technol., Shanxi, China
fDate :
30 Aug-3 Sep 1992
Abstract :
Proposes a one dimensional multiple scale edge detector, which, through edge classification and matching procedure, can eliminate edge shifting caused by asymmetric profile and neighboring edges and make the multiple scale edge synthesizing quite easy. An implementation of this algorithm is then preserved. A quantitative analysis on edge delocalization caused by noise is also given. The stochastic properties of noise edge bias are formulated. The algorithm is illustrated on several examples
Keywords :
edge detection; noise; 1D multiple scale edge detection; edge classification; edge delocalization; edge synthesizing; image recognition; noise edge bias; quantitative analysis; Convolution; Detectors; Filters; Image edge detection; Paper technology; Performance analysis; Stochastic resonance; Working environment noise;
Conference_Titel :
Pattern Recognition, 1992. Vol.III. Conference C: Image, Speech and Signal Analysis, Proceedings., 11th IAPR International Conference on
Conference_Location :
The Hague
Print_ISBN :
0-8186-2920-7
DOI :
10.1109/ICPR.1992.202018
