Title :
Learning structural and corruption information from samples for Markov random field binary image reconstruction
Author :
Milun, Davin ; Sher, David
Author_Institution :
Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA
fDate :
30 Aug-3 Sep 1992
Abstract :
The authors have advanced Markov random field research by addressing the issue of obtaining a reasonable, nontrivial, noise model. They address this issue by looking at original images together with noisy imagery, and so creating a probability distribution for pairs of neighborhoods across both images. This models the noise within the MRF probability distribution, and provides an easy way to generate Markov random fields for annealing or other relaxation methods
Keywords :
Markov processes; image reconstruction; interference (signal); probability; Markov random field binary image reconstruction; annealing; corruption information; gradient descent algorithm; noise model; noisy imagery; probability distribution; relaxation methods; Computer science; Frequency; Image edge detection; Image reconstruction; Labeling; Markov random fields; Noise figure; Noise generators; Pixel; Probability distribution;
Conference_Titel :
Pattern Recognition, 1992. Vol.III. Conference C: Image, Speech and Signal Analysis, Proceedings., 11th IAPR International Conference on
Conference_Location :
The Hague
Print_ISBN :
0-8186-2920-7
DOI :
10.1109/ICPR.1992.202037