• DocumentCode
    306323
  • Title

    Statistical tolerance and clearance analysis for assembly

  • Author

    Lee, Sukhan ; Yi, Chunsik

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Southern California, Los Angeles, CA, USA
  • Volume
    2
  • fYear
    1996
  • fDate
    4-8 Nov 1996
  • Firstpage
    688
  • Abstract
    In this paper, we present statistical tolerance and clearance analysis for the assembly. Tolerances work against the assemblability of a product since they can propagate and accumulate in the product, making it more difficult or impossible to assemble. Clearances work for the assemblability since they can be used to compensate for tolerances. The poses of parts in an assemble may be adjusted within the permitted clearances to assemble the parts. Monte-Carlo method is used in the analysis, with Gaussian distribution, Gaussian-Sigmoid distribution, and Chi-Square error reduction scheme to approximate tolerances and clearances. Then, algorithms to compute the propagation of tolerances and clearances are proposed. Our proposed work is expected to make the following contributions: 1) to help the designers to evaluate products for assemblability, 2) to provide a new perspective to tolerance problems, and 3) to provide a tolerance analysis tool which can be incorporated into a CAD or solid modeling system
  • Keywords
    Gaussian distribution; Monte Carlo methods; assembling; production control; production engineering computing; statistical analysis; tolerance analysis; Chi-Square error reduction; Gaussian distribution; Gaussian-Sigmoid distribution; Monte-Carlo method; assemblability; assembly; statistical clearance analysis; statistical tolerance; Assembly systems; Computer aided manufacturing; Computer science; Cost function; Design automation; Ellipsoids; Gaussian distribution; Product design; Shape; Tolerance analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Robots and Systems '96, IROS 96, Proceedings of the 1996 IEEE/RSJ International Conference on
  • Conference_Location
    Osaka
  • Print_ISBN
    0-7803-3213-X
  • Type

    conf

  • DOI
    10.1109/IROS.1996.571038
  • Filename
    571038