Title :
A comparison between FFT and MCT for period measurement with an ARM microcontroller
Author :
Guia, S.S. ; Espirito-Santo, A. ; Paciello, V. ; Abate, F. ; Pietrosanto, A.
Author_Institution :
Electromech. Eng. Dept., Univ. of Beira Interior, Covilha, Portugal
Abstract :
A comparison between two different algorithms to measure the period of a signal is performed on this work. One of the algorithms is based on the Fast Fourier Transformation (FFT) measurement procedure, whereas the other is based on the Segmentation and Labeling algorithm (MCT). Both algorithms have been prepared for implementation in a microcontroller with ARM architecture. The measurement operation of each one of the algorithms is described in detail. Experimental results are reported, with the purpose of demonstrating both performance and output format for signal analysis.
Keywords :
fast Fourier transforms; microcontrollers; ARM architecture; FFT measurement procedure; MCT; fast Fourier transformation measurement procedure; microcontroller; segmentation and labeling algorithm; signal analysis; Frequency estimation; ISO standards; Microcontrollers; Xenon; FFT algorithm; IEEE 1451; MCT algorithm; Microcontroller; Period Measurement; Signal Processing;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
Conference_Location :
Pisa
DOI :
10.1109/I2MTC.2015.7151578
