DocumentCode
3063260
Title
A comparison between FFT and MCT for period measurement with an ARM microcontroller
Author
Guia, S.S. ; Espirito-Santo, A. ; Paciello, V. ; Abate, F. ; Pietrosanto, A.
Author_Institution
Electromech. Eng. Dept., Univ. of Beira Interior, Covilha, Portugal
fYear
2015
fDate
11-14 May 2015
Firstpage
1938
Lastpage
1942
Abstract
A comparison between two different algorithms to measure the period of a signal is performed on this work. One of the algorithms is based on the Fast Fourier Transformation (FFT) measurement procedure, whereas the other is based on the Segmentation and Labeling algorithm (MCT). Both algorithms have been prepared for implementation in a microcontroller with ARM architecture. The measurement operation of each one of the algorithms is described in detail. Experimental results are reported, with the purpose of demonstrating both performance and output format for signal analysis.
Keywords
fast Fourier transforms; microcontrollers; ARM architecture; FFT measurement procedure; MCT; fast Fourier transformation measurement procedure; microcontroller; segmentation and labeling algorithm; signal analysis; Frequency estimation; ISO standards; Microcontrollers; Xenon; FFT algorithm; IEEE 1451; MCT algorithm; Microcontroller; Period Measurement; Signal Processing;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
Conference_Location
Pisa
Type
conf
DOI
10.1109/I2MTC.2015.7151578
Filename
7151578
Link To Document