Title :
Built-In Self-Test of digital signal processors in Virtex-4 FPGAs
Author :
Pulukuri, Mary D. ; Stroud, Charles E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Auburn Univ., Auburn, AL
Abstract :
We present a Built-In Self-Test (BIST) approach for testing and diagnosing the embedded digital signal processors (DSPs) in Xilinx Virtex-4 series Field Programmable Gate Arrays (FPGAs). The BIST architecture and configurations needed to test these programmable DSPs in all of their modes of operation are presented along with fault injection and timing analysis of the BIST configurations.
Keywords :
built-in self test; digital signal processing chips; fault diagnosis; field programmable gate arrays; timing; BIST architecture; BIST configuration; Virtex-4 FPGA; Xilinx Virtex-4 series; built-in self-test; embedded digital signal processors; fault injection; field programmable gate arrays; programmable DSP; timing analysis; Automatic testing; Built-in self-test; Digital signal processing; Digital signal processors; Embedded computing; Field programmable gate arrays; Logic arrays; Logic programming; Logic testing; Programmable logic arrays; Built-In Self-Test; Field Programmable Gate Array; Virtex-4; adder test; digital signal processor; multiplier test;
Conference_Titel :
System Theory, 2009. SSST 2009. 41st Southeastern Symposium on
Conference_Location :
Tullahoma, TN
Print_ISBN :
978-1-4244-3324-7
Electronic_ISBN :
0094-2898
DOI :
10.1109/SSST.2009.4806783
