Title :
Specification and measurement of the frequency versus temperature characteristics of crystal oscillators
Author :
Filler, Raymond L. ; Rosati, Vincent J. ; Schodowski, Stanley S. ; Vig, John R.
Author_Institution :
US Army Electron. Technol. & Devices Lab., Fort Monmouth, NJ, USA
fDate :
31 May-2 Jun 1989
Abstract :
Several factors are reviewed for specifying and measuring the frequency vs. temperature (f-T) characteristics of precision quartz crystal oscillators. Topics include static vs. dynamic measurement, thermal time constant, activity dips, condensables, hysteresis, and trim effect. This work reviews some f-T considerations that are not discussed in detail in MIL-0-55310
Keywords :
crystal resonators; environmental testing; frequency measurement; frequency stability; oscillators; quartz; MIL-0-55310; SiO2; activity dips; condensables; considerations; crystal oscillators; dynamic measurement; frequency stability; frequency versus temperature characteristics; hysteresis; measurement; precision quartz crystal oscillators; specification; static measurement; thermal time constant; trim effect; Costs; Frequency measurement; Hysteresis; Oscillators; Ovens; Stability; Switches; Temperature distribution; Testing; Time measurement;
Conference_Titel :
Frequency Control, 1989., Proceedings of the 43rd Annual Symposium on
Conference_Location :
Denver, CO
DOI :
10.1109/FREQ.1989.68874
