DocumentCode
3064081
Title
Protecting RF ICs: a new reliability challenge
Author
Wang, Albert
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
fYear
2004
fDate
24-27 Aug. 2004
Abstract
The paper reviews current developments in designing and characterizing on-chip ESD (electrostatic discharge) protection circuits for RF ICs. ESD protection basics, key issues in RF ESD protection, design methods, RF ESD protection evaluation techniques and RF ESD protection solutions are discussed.
Keywords
circuit simulation; electromagnetic coupling; electrostatic discharge; integrated circuit design; integrated circuit reliability; radiofrequency integrated circuits; RF IC protection; RFIC protection; design methods; electrostatic discharge protection circuits; evaluation techniques; multi-level coupling effects; on-chip ESD protection circuits; reliability; Clamps; Electrostatic discharge; MOS devices; Predictive models; Protection; Radio frequency; Radiofrequency integrated circuits; Thermal resistance; Variable structure systems; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Radio Science Conference, 2004. Proceedings. 2004 Asia-Pacific
Print_ISBN
0-7803-8404-0
Type
conf
DOI
10.1109/APRASC.2004.1422377
Filename
1422377
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