Title :
Protecting RF ICs: a new reliability challenge
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
Abstract :
The paper reviews current developments in designing and characterizing on-chip ESD (electrostatic discharge) protection circuits for RF ICs. ESD protection basics, key issues in RF ESD protection, design methods, RF ESD protection evaluation techniques and RF ESD protection solutions are discussed.
Keywords :
circuit simulation; electromagnetic coupling; electrostatic discharge; integrated circuit design; integrated circuit reliability; radiofrequency integrated circuits; RF IC protection; RFIC protection; design methods; electrostatic discharge protection circuits; evaluation techniques; multi-level coupling effects; on-chip ESD protection circuits; reliability; Clamps; Electrostatic discharge; MOS devices; Predictive models; Protection; Radio frequency; Radiofrequency integrated circuits; Thermal resistance; Variable structure systems; Voltage;
Conference_Titel :
Radio Science Conference, 2004. Proceedings. 2004 Asia-Pacific
Print_ISBN :
0-7803-8404-0
DOI :
10.1109/APRASC.2004.1422377
