Title :
Exploring long-term behavior of analog to digital converters
Author :
Jiang, Fangliang
Author_Institution :
Beijing Orient Inst. of Test & Meas., CAST, Beijing, China
Abstract :
The accuracy of analog to digital converter (ADC), differential nonlinearity (DNL) and integral nonlinearity (INL), was continuously measured for one year. This paper presents the measurement experiment, explains the method of data analysis, and discusses the results. The long-term stability and repeatability turns out to be limited mainly by temperature drift and random errors.
Keywords :
analogue-digital conversion; circuit stability; nonlinear network analysis; ADC accuracy; DNL; INL; analog to digital converters; differential nonlinearity; integral nonlinearity; long-term drift; long-term repeatability; long-term stability; random errors; temperature drift; Analog-digital conversion; Clocks; Data analysis; Histograms; Linearity; Metrology; Signal generators; Stability; System testing; Temperature;
Conference_Titel :
Radio Science Conference, 2004. Proceedings. 2004 Asia-Pacific
Print_ISBN :
0-7803-8404-0
DOI :
10.1109/APRASC.2004.1422382
