DocumentCode :
3064318
Title :
Face recognition at-a-distance using texture and sparse-stereo reconstruction
Author :
Rara, Ham ; Farag, Aly ; Elhabian, Shireen ; Ali, Asem ; Miller, William ; Starr, Thomas ; Davis, Todd
Author_Institution :
CVIP Lab., Univ. of Louisville, Louisville, KY, USA
fYear :
2010
fDate :
27-29 Sept. 2010
Firstpage :
1
Lastpage :
6
Abstract :
We propose a framework for face recognition at a distance based on texture and sparse-stereo reconstruction. We develop a 3D acquisition system that consists of two CCD stereo cameras mounted on pan-tilt units with adjustable baseline. We first detect the facial region and extract its landmark points, which are used to initialize the face alignment algorithm. The fitted mesh vertices, generated from the face alignment process, provide point correspondences between the left and right images of a stereo pair; stereo-based reconstruction is then used to infer the 3D information of the mesh vertices. We perform experiments regarding the use of different features extracted from these vertices for face recognition. The local patches around the landmark points are also well-suited for Gabor-based and LBP-based recognition. The cumulative rank curves (CMC), which are generated using the proposed framework, confirm the feasibility of the proposed work for long distance recognition of human faces.
Keywords :
CCD image sensors; Gabor filters; data acquisition; face recognition; feature extraction; image reconstruction; statistical analysis; stereo image processing; 3D acquisition system; CCD stereo camera; Gabor based recognition; LBP-based recognition; adjustable baseline; cumulative rank curve; face alignment algorithm; face recognition; feature extraction; fitted mesh vertice; pan-tilt unit; sparse stereo reconstruction; texture reconstruction; Face; Face recognition; Feature extraction; Histograms; Image reconstruction; Iris recognition; Pixel;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biometrics: Theory Applications and Systems (BTAS), 2010 Fourth IEEE International Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-7581-0
Electronic_ISBN :
978-1-4244-7580-3
Type :
conf
DOI :
10.1109/BTAS.2010.5634476
Filename :
5634476
Link To Document :
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