Title :
Short Inner Block Codes for Serial Concatenated Codes and Bit-Interleaved Coded Modulation
Author :
Muhammad, Nabil Sven
Author_Institution :
Eur. Technol. Center (EuTEC), Sony Deutschland GmbH, Stuttgart, Germany
Abstract :
We compute closed-form transfer characteristics for EXIT chart of short rate 1 block codes for binary erasure channel. These functions closely approximate the measurements over additive white Gaussian noise (AWGN) channel. Optimum irregular inner codes are derived for serial concatenated coding over AWGN channel. In addition, we apply the results on bitinterleaved coded modulation (BICM) and introduce signal set capacity on bit level. It is pointed out that capacity approaching performance with BICM requires new modulation schemes.
Keywords :
AWGN channels; channel capacity; concatenated codes; interleaved codes; additive white Gaussian noise channel; binary erasure channel; bit-interleaved coded modulation; serial concatenated codes; short inner block codes; signal set capacity; AWGN; Additive white noise; Binary phase shift keying; Block codes; Concatenated codes; Interleaved codes; Iterative decoding; Modulation coding; Quadrature amplitude modulation; Transmitters;
Conference_Titel :
Vehicular Technology Conference Fall (VTC 2009-Fall), 2009 IEEE 70th
Conference_Location :
Anchorage, AK
Print_ISBN :
978-1-4244-2514-3
Electronic_ISBN :
1090-3038
DOI :
10.1109/VETECF.2009.5378697
