Title :
Fault detection for mixed signal ICs by current integration
Author_Institution :
Dept. of Comput. Sci. & Eng., Taiyuan Univ. of Technol., China
Abstract :
A fault detection method for mixed signal integrated circuits by the current integral is proposed. Monitoring the integral of the supply current is specially used for real time, batch testing for mixed signal integrated circuits because additional computation and comparing the obtained current waveforms with the free fault current do not required. Two bit parallel comparison CMOS AD converter is adopted as the circuit under test. The integral of the supply current is only monitored during one clock period when the input stimulus is applied, determining whether the circuit is free fault
Keywords :
CMOS integrated circuits; analogue-digital conversion; fault diagnosis; integrated circuit testing; integrating circuits; mixed analogue-digital integrated circuits; CMOS AD converter; current integration; fault detection; mixed signal integrated circuit; real-time batch testing; Circuit testing; Clocks; Current supplies; Electrical fault detection; Fault currents; Fault detection; Integrated circuit testing; Mixed analog digital integrated circuits; Monitoring; Signal detection;
Conference_Titel :
Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-4306-9
DOI :
10.1109/ICSICT.1998.785907
