Title :
VLSI architecture for parallel concentration-contour approach
Author :
Tang, Yuan Y. ; Cheng, X. ; Tao, Lixin ; Suen, Ching Y. ; Talaat, M. ; Inglese, R.
Author_Institution :
Dept. of Comput. Sci., Concordia Univ., Montreal, Que., Canada
fDate :
30 Aug-3 Sep 1992
Abstract :
A method called concentration-contour method is presented. It transforms a compound pattern into an integral one where contour analysis can be used. The concentration-contour method consists of four phases: (1) concentration of pattern, (2) extraction of contour, (3) transformation of numerical features, and (4) classification. The diagonal-diagonal regional projection transformation (DDRPT), which converts a compound pattern into an integral object, has been used. A VLSI architecture to implement the concentration-contour approach has been designed. The time complexity of the method is only O(N) compared with O(N2) when a uniprocessor is used
Keywords :
VLSI; computational complexity; digital signal processing chips; image processing equipment; image recognition; parallel algorithms; parallel architectures; pipeline processing; 2D mesh connected processor array; VLSI architecture; compound pattern; concentration-contour method; diagonal-diagonal regional projection transformation; integral object; pipelining; time complexity; Classification tree analysis; Computer architecture; Computer science; Concurrent computing; Euclidean distance; Parallel algorithms; Parallel processing; Pattern analysis; Pattern recognition; Very large scale integration;
Conference_Titel :
Pattern Recognition, 1992. Vol. IV. Conference D: Architectures for Vision and Pattern Recognition, Proceedings., 11th IAPR International Conference on
Conference_Location :
The Hague
Print_ISBN :
0-8186-2925-8
DOI :
10.1109/ICPR.1992.202153
