Title :
Numerical simulation of semiconductor devices considering self-heating effects
Author :
Ming, Hao ; Lilin, Tian ; Zhiping, Yu
Author_Institution :
Inst. of Microelectron., Tsinghua Univ., Beijing, China
Abstract :
Electro-thermal simulation, which considers the influence of self-heating effects an semiconductor devices, is becoming more and more important. But as the popular device simulator, PISCES-2ET needs a big improvement in order to realize simulation including lattice temperature, since the simulator has paid more attention to carrier temperature rather than lattice temperature. This paper presents an electro-thermal device simulation program which is developed on the basis of the device simulation program PISCES-2H. In comparison with PISCES-2ET, our program includes the influence of lattice temperature on Poisson´s equation and the electric field, providing additional thermal boundary conditions and temperature dependent models. Furthermore, two additional numerical methods are adopted according to the characteristics of the electro-thermal simulation in our program. They are more suitable for simulation considering self-heating effects than the common Gummel and full Newton methods
Keywords :
Poisson equation; electronic engineering computing; numerical analysis; semiconductor device models; thermal analysis; PISCES-2H; Poisson equation; electric field; electro-thermal simulation; lattice temperature; numerical simulation; self-heating effects; semiconductor devices; simulation program; temperature dependent models; thermal boundary conditions; Boundary conditions; Charge carrier processes; Conducting materials; Lattices; Microelectronics; Numerical simulation; Poisson equations; Semiconductor devices; Temperature dependence; Thermal conductivity;
Conference_Titel :
Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-4306-9
DOI :
10.1109/ICSICT.1998.785924