DocumentCode
3065100
Title
The algorithms of inserting boundary-scan circuit automatically
Author
Zhu, GuoHun ; Yan, Xuelong ; Zhou, Ya ; Guo, YueRen
Author_Institution
Guilin Inst. of Electron. Technol., China
fYear
1998
fDate
1998
Firstpage
527
Lastpage
531
Abstract
Boundary Scan is one of the most popular technique of DFT (Design For Testability) today. Although some tools can automatically insert and verify boundary-scan circuitry, but they are not easily used. So we designed a set of tools. The tool set can process the RTL and behavioral VHDL files, distinguish the source files with boundary-scan circuitry, generate VHDL with IEEE 1149.1 compliant boundary scan circuitry. This paper describes the main algorithms of boundary-scan in detail. First the tools scan the VHDL source code and obtain the pin and the pin types. Next they consider the bidirectional signal, a 3-state signal which controlled pins BSCs (boundary-scan calls) configuration and process the clock pin. Finally, the corresponding VHDL and BSDL files and test bench files with IEEE defined basic instructions, are generated
Keywords
boundary scan testing; design for testability; hardware description languages; integrated circuit design; integrated circuit testing; logic CAD; logic testing; 3-state signal; BSDL files generation; CAD; DFT; IEEE 1149.1 compliant BS circuitry; RTL files; VHDL files generation; automatic insertion; behavioral VHDL files; bidirectional signal; boundary-scan calls; boundary-scan circuitry; design for testability; pin types; source files; test bench files; Algorithm design and analysis; Circuits; Data models; Indium phosphide; Information analysis; Libraries; Signal analysis; Signal design; Signal generators; Signal processing;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
Conference_Location
Beijing
Print_ISBN
0-7803-4306-9
Type
conf
DOI
10.1109/ICSICT.1998.785938
Filename
785938
Link To Document