• DocumentCode
    3065100
  • Title

    The algorithms of inserting boundary-scan circuit automatically

  • Author

    Zhu, GuoHun ; Yan, Xuelong ; Zhou, Ya ; Guo, YueRen

  • Author_Institution
    Guilin Inst. of Electron. Technol., China
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    527
  • Lastpage
    531
  • Abstract
    Boundary Scan is one of the most popular technique of DFT (Design For Testability) today. Although some tools can automatically insert and verify boundary-scan circuitry, but they are not easily used. So we designed a set of tools. The tool set can process the RTL and behavioral VHDL files, distinguish the source files with boundary-scan circuitry, generate VHDL with IEEE 1149.1 compliant boundary scan circuitry. This paper describes the main algorithms of boundary-scan in detail. First the tools scan the VHDL source code and obtain the pin and the pin types. Next they consider the bidirectional signal, a 3-state signal which controlled pins BSCs (boundary-scan calls) configuration and process the clock pin. Finally, the corresponding VHDL and BSDL files and test bench files with IEEE defined basic instructions, are generated
  • Keywords
    boundary scan testing; design for testability; hardware description languages; integrated circuit design; integrated circuit testing; logic CAD; logic testing; 3-state signal; BSDL files generation; CAD; DFT; IEEE 1149.1 compliant BS circuitry; RTL files; VHDL files generation; automatic insertion; behavioral VHDL files; bidirectional signal; boundary-scan calls; boundary-scan circuitry; design for testability; pin types; source files; test bench files; Algorithm design and analysis; Circuits; Data models; Indium phosphide; Information analysis; Libraries; Signal analysis; Signal design; Signal generators; Signal processing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    0-7803-4306-9
  • Type

    conf

  • DOI
    10.1109/ICSICT.1998.785938
  • Filename
    785938