Title : 
Extension of replica analysis to MAP estimation with applications to compressed sensing
         
        
            Author : 
Rangan, Sundeep ; Fletcher, Alyson K. ; Goyal, Vivek K.
         
        
            Author_Institution : 
Polytech. Inst. of New York Univ., New York, NY, USA
         
        
        
        
        
        
            Abstract : 
The replica method is a non-rigorous but widely-accepted technique from statistical physics used in the asymptotic analysis of large, random, nonlinear problems. This paper applies the replica method to analyze non-Gaussian maximum a posteriori (MAP) estimation. The main result is a counterpart to Guo and Verdú´s replica analysis of minimum mean-squared error estimation. The replica MAP analysis can be readily applied to many estimators used in compressed sensing, including basis pursuit, lasso, linear estimation with thresholding, and zero norm-regularized estimation. Among other benefits, the replica method provides a computationally-tractable method for exactly computing various performance metrics including mean-squared error and sparsity pattern recovery probability.
         
        
            Keywords : 
maximum likelihood estimation; mean square error methods; sensors; MAP estimation; asymptotic analysis; basis pursuit; compressed sensing; lasso; linear estimation; minimum mean-squared error estimation; non-Gaussian maximum a posteriori estimation; replica MAP analysis; replica analysis; statistical physics; zero norm-regularized estimation; Algorithm design and analysis; Coherence; Compressed sensing; Convergence; Distributed computing; Error analysis; Noise measurement; Physics; Pursuit algorithms; Vectors;
         
        
        
        
            Conference_Titel : 
Information Theory Proceedings (ISIT), 2010 IEEE International Symposium on
         
        
            Conference_Location : 
Austin, TX
         
        
            Print_ISBN : 
978-1-4244-7890-3
         
        
            Electronic_ISBN : 
978-1-4244-7891-0
         
        
        
            DOI : 
10.1109/ISIT.2010.5513520