DocumentCode
3065699
Title
The study on the optical properties of GaN detector on the 6H-SiC substrates
Author
Zang, L. ; Shen, B. ; Yang, K. ; Chen, P. ; Zhang, R. ; Chen, Z.Z. ; Zhou, Y.G. ; Zheng, Y.D.
Author_Institution
Dept. of Phys., Nanjing Univ., China
fYear
1998
fDate
1998
Firstpage
622
Lastpage
624
Abstract
We have studied the optical properties of the ultraviolet detector based on the GaN epilayer grown on 6H-SiC substrate by metalorganic chemical vapor deposition. We obtained the detectable energy span of the device up to ultraviolet by photocurrent measurement. The spectral responsivity remained nearly constant for wavelengths from 250 to 365 nm and dropped by three orders of magnitude within 10 nm of the band edge (by 380 nm). The detector was measured to have a responsivity of 133 A/W at a wavelength of 360 nm under a 5-V bias, and the voltage-dependent responsivity was performed. Furthermore, an easy method was developed to determine the response time and the relationship between response time and bias was obtained
Keywords
III-V semiconductors; gallium compounds; photoconductivity; photodetectors; semiconductor device measurement; semiconductor epitaxial layers; silicon compounds; ultraviolet detectors; wide band gap semiconductors; 250 to 380 nm; 5 V; 6H-SiC substrates; GaN detector; GaN epilayer; GaN-SiC; SiC; bias; detectable energy span; metalorganic chemical vapor deposition; optical properties; photocurrent measurement; response time; responsivity; spectral responsivity; ultraviolet detector; voltage-dependent responsivity; Delay; Detectors; Electrical resistance measurement; Gallium nitride; Optical surface waves; Photoconductivity; Photodetectors; Substrates; Voltage; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
Conference_Location
Beijing
Print_ISBN
0-7803-4306-9
Type
conf
DOI
10.1109/ICSICT.1998.785966
Filename
785966
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