Title :
Address Sequences Generation for Multiple Run Memory Testing
Author :
Yarmolik, S.V. ; Mrozek, I. ; Sokol, B.
Author_Institution :
Belarusian State Univ. of Informatics & Radioel., Minsk
Abstract :
This paper deals with address generation for multiple run memory tests. It presents the algorithms for address sequences generation and proposes the new method for address sequences generation. The experimental results with the proposed address sequence are also shown.
Keywords :
binary sequences; storage management; testing; address sequences generation; binary sequence; multiple run memory testing; Binary sequences; Computer industry; Conference management; Counting circuits; Fault detection; Hardware; Informatics; Management information systems; Reflective binary codes; Testing;
Conference_Titel :
Computer Information Systems and Industrial Management Applications, 2007. CISIM '07. 6th International Conference on
Conference_Location :
Minneapolis, MN
Print_ISBN :
0-7695-2894-5
DOI :
10.1109/CISIM.2007.9
