Title :
The analysis of thermal characteristics of the laser diode by transient thermal response method
Author :
Shiwei, Feng ; Xuesong, Xie ; Wei, Liu ; Changzhi, Lu ; Yan, He ; GuangDi, Shen
Author_Institution :
Dept. of Electron. Eng., Beijing Polytech. Univ., China
Abstract :
Using the terminal voltage method, we measured and analyzed the thermal characteristics of the laser diodes (LD). From heating response curves, it is possible to determine the thermal resistance, Rth of different layers of the packaged LDs. The dependence of the R th on the working current was measured. It shows much difference between below and above threshold current. This gives much information about the coupling between thermal and optical properties
Keywords :
semiconductor device measurement; semiconductor lasers; thermal resistance; heating response curves; laser diode; terminal voltage method; thermal characteristics; thermal resistance; threshold current; transient thermal response method; working current; Diode lasers; Electrical resistance measurement; Electronic packaging thermal management; Resistance heating; Temperature; Testing; Thermal resistance; Threshold current; Transient analysis; Voltage;
Conference_Titel :
Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-4306-9
DOI :
10.1109/ICSICT.1998.785973
