• DocumentCode
    3065918
  • Title

    Robust spots finding in microarray images with distortions

  • Author

    Figueroa, Andres ; Tsai, Ping-Sing ; Bent, Elizabeth ; Guo, Rongkai

  • Author_Institution
    Department of Computer Science, The University of Texas - Pan American, Edinburg, 78539 USA
  • fYear
    2008
  • fDate
    20-25 Aug. 2008
  • Firstpage
    1339
  • Lastpage
    1342
  • Abstract
    Microarray images, which allow the analysis of hybridization expressions of genes, have been one of the most widely used high-throughput technologies with many different applications. Accurate and automatic microarray image analysis is very important since researchers trust the information provided in these experiments and construct conclusions based on the results produced by the software responsible in analyzing the hybridized arrays. Every microarray image contains thousands of spots, so how to do the spots finding in microarray images accurately and automatically is very meaningful. There are always some problems, such as rotation and distortion, in a microarray image caused by mechanical errors and/or optical errors in the system. All these problems will hinder doing analysis automatically. Early research has worked out several algorithms to deal with the rotation problem, but those algorithms can not handle microarray images with distortions. In this paper, we propose a robust spots finding method to deal with both rotation and/or distortion in microarray images. The proposed method provides automatic gridding and can handle a microarray image with different type of rotation (global or sub-array rotation) and optical distortions.
  • Keywords
    Cloning; DNA; Fingerprint recognition; IEEE members; Image analysis; Image segmentation; Optical distortion; Probes; Robustness; Sequences; Image Interpretation, Computer-Assisted; Oligonucleotide Array Sequence Analysis; Pattern Recognition, Automated;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE
  • Conference_Location
    Vancouver, BC
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-1814-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2008.4649412
  • Filename
    4649412